8

X-ray photoelectron spectroscopic analysis of HfO2/Hf/SiO2/Si structure

Year:
2005
Language:
english
File:
PDF, 173 KB
english, 2005
48

First-principles study of defect-induced potentials in

Year:
2009
Language:
english
File:
PDF, 1.24 MB
english, 2009